1887
ASEG2001 - 15th Geophysical Conference
  • ISSN: 2202-0586
  • E-ISSN:

Abstract

The Elang formation produces a weak event which is virtually impossible to pick on conventionally processed seismic sections. Its top is difficult to define on wireline logs. A rigorous approach to modelling its reflectivity is as a superposition of reflections from a sequence of layers at < 2m thickness. This verifies that AVO can be derived for interfaces near the top of the Elang if V,V and p are averaged over at least 10m above and 10m below this interface. Using a depth of 3264m for Top Elang this method predicts a polarity reversal at ray parameter, p=0.105 s/km (about mid-streamer).

However, at near-to-mid streamer offsets (p < 0.105 s/km) the reflectivity is too sensitive to depth to derive an AVO representative of the Elang. At Laminaria East, the full depth model predicts a peak/trough wavelet at the TWT near top Elang (3215ms) which is grossly influenced by the sidelobes of boundaries beneath the reservoir.

At far offsets (p > 0.105 s/km) a consistent trough develops in the x-p formation response which extends out to an equivalent 8km source/receiver offset. This trough is clear on the full model seismogram when multiples and guided waves are suppressed. It may provide the basis for defining a more interpretable signature for the Elang by weighting far offsets traces and perhaps acquiring data out to very long offsets.

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/content/journals/10.1071/ASEG2001ab006
2001-12-01
2026-01-22
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References

  1. Kennett, B.L.N., 1979, Theoretical reflection seismograms for elastic media: Geophysical Prospecting, 27, 301-321.
  2. Walden, A.T., and Hosken, J.W.J, 1988, Choosing the averaging interval when calculating primary reflection coefficients from well logs: Geophysical Prospecting, 36, 799-824.
  3. Zhao, P. and Beresford, G, 1997, A quick and efficient method for canonical model building, 67th Meeting, SEG, Expanded Abstracts.
/content/journals/10.1071/ASEG2001ab006
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  • Article Type: Research Article
Keyword(s): AVO; elastic modelling; x-p
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