1887

Abstract

Since 1999, dual-array electromagnetic (EM) instruments have been used to identify the presence of layering of electrical conductivity in<br>the upper-few metres of the earth. Newly introduced instruments with multiple arrays can provide more detailed information about conductive<br>layering. Examples and a simulation show that the detailed measurements from the multiple-array instruments can estimate the conductivity<br>and thickness of a surficial layer, as well as the conductivity of the earth that underlies the layer.

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/content/papers/10.3997/2214-4609-pdb.157.sageep099
2009-03-29
2021-10-16
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609-pdb.157.sageep099
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