Detailed information on vertical resistivity variations is relevant as an indicator of change in<br>lithology, porefluid chemistry, porosity and permeability. Traditionally the formation resistivity<br>is estimated solely on curves of the observed data, which are plotted as apparent resistivity data.<br>Apparent resistivity data may be a poor approximation to the local formation resistivity, and it<br>can be impossible to determine the resistivity levels and the location of the layer-interfaces. Jn<br>this paper we will present results of deconvolution of normal log apparent resistivity data.<br>Deconvolution of data using dual electrode offsets gives a significantly enhanced resolution of<br>the formation resistivity when moderate resistivity contrasts are considered.


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