CRS-Stack-Based Seismic Reflection Imaging – A Real Data Example

P211 CRS-STACK-BASED SEISMIC REFLECTION IMAGING – A REAL DATA EXAMPLE Z. HEILMANN J. MANN E. DUVENECK and T. HERTWECK Geophysical Institute University of Karlsruhe Hertzstr. 16 76187 Karlsruhe Germany Summary. In recent years it was demonstrated in many cases that the Common-Reflection-Surface (CRS) stack produces reliable stack sections with high resolution and excellent signal-to-noise ratio. As a byproduct of the data-driven stacking process an entire set of physically interpretable stacking parameters so-called kinematic wavefield attributes is determined. These CRS attributes may be even more important than the stack section itself because they can be applied in further processing to solve