1887

Abstract

Reflections from a single thin bed or a stack of thin layers are distinct from reflections associated with a single interface. In this study, we apply the propagator matrix approach to calculate frequency-dependent reflection coefficients resulting from layered structures, and propose a model-based scheme for the simultaneous inversion of thickness and material properties of the structured layers. We demonstrate the method using a single thin bed model for the inversion of porosity and thickness of the thin layer. We parameterize the thickness and porosity by empirical rock physics models and define error functions by the mean square roots of the difference between the predicted and observed AVO responses. The purpose is to find the values of thickness and porosity by minimizing the designed error function. The method produces inversion results with reasonable accuracy. We then apply the approach to the Bakken Formation for the characterization of the fracture zone and associated thickness. The self-consistent approximation rock physics method is employed for the parameterization of the crack density which is ready to be inverted, and the inversion results present reasonable agreements between inverted and real values of crack density and associated thickness of the fracture zone in the Bakken Formation.

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/content/papers/10.3997/2214-4609.20130269
2013-06-10
2024-03-29
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609.20130269
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