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Abstract

Near Surface Noise Characterization With Multicomponent Measurements Ed Kragh (Schlumberger Cambridge Research (SCR)) and Everhard Muyzert (Schlumberger Cambridge Research (SCR)) SUMMARY____________________________________________________________ On land the effect of the near-surface is the major cause of poor seismic data quality. Surface noise heterogeneity causing scattering statics coupling variations wavefield attenuation and anisotropy all degrade the quality of the wavefield recorded at the surface. To further improve the quality of land seismic data one approach is to gain a fundamental understanding of the wave propagation in the near-surface. As an example a consistent observation which requires explaining is the amount of cross-line energy recorded

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/content/papers/10.3997/2214-4609.201405116
2007-06-10
2020-04-08
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609.201405116
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