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Abstract

Surface and guided waves are effective sources of information for near-surface characterization. They constitute a large part of the recorded energy and, with proper acquisition, analysis, and inversion, can be used to model the near surface with surprisingly high resolution. In this role, they can be used for correcting short- to long-wavelength perturbations, building velocity models, and optimizing coherent noise-filtering workflows.

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/content/papers/10.3997/2214-4609.20140534
2014-06-16
2024-03-28
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609.20140534
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