Resolution Improvements Achieved with the I/O MEMS Accelerometer

The Input/Output MEMS accelerometer (a.k.a. VectorSeis®) has been undergoing field testing<br>since late 1999. From the results of the first commercial survey it was apparent that the sensor<br>could provided an improvement in both vertical and lateral and resolution. Since that first<br>survey in 1999, numerous improvements in both the sensor and the processing techniques<br>have resulted in consistent resolution improvements in the datasets acquired.