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In this paper we apply a tomographic approach to the reconstruction of dielectric profiles<br>embedded in a layered medium. The approach is formulated in the framework of the<br>linearized approximation, and exploits the tool of the Singular Value Decomposition (SVD).<br>Numerical examples provided in a two-dimensional and scalar case, assess feasibility of the<br>approach and its robustness against noise on data in practical situations.<br>Key words: GPR, Microwave Tomography, Inverse Scattering.