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Abstract

A new analytical i.e. - for more complex cases - a numerical model is proposed for evaluating weIl tests. The analytical solution can be applied to special cases, whereas the numerical model is fuIly explicit, and can be used to complex weIl pattems, arbitrary grid geometry with general shape signal generation.

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/content/papers/10.3997/2214-4609.201406897
1996-09-03
2024-04-25
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609.201406897
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