1887

Abstract

Summary

We have developed a robust method of estimating surface-consistent residual wavelet phase that is based on the simultaneous maximization of stack-power as a function of both statics and phase. Real data examples show that stack-power and image quality are improved in a robust fashion with the simultaneous estimation of statics and phase corrections. We typically apply the process after residual statics are applied, and we observe that the algorithm comes up with statics and phase corrections that are strongly anti-correlated. We explain the observed anti-correlation by the fact that previous residual statics steps in the processing flow were improperly trying to correct residual phase errors with statics corrections. Maps of phase errors often show good correlation with features of the surface topography. In addition, phase differences between different source types are reliably estimated with the new algorithm when compared with a standard method of phase estimation at overlapping CDP stack locations. These observations lead us to believe that the phase errors that are estimated with this method are real and are being robustly estimated.

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/content/papers/10.3997/2214-4609.20140695
2014-06-16
2024-03-28
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References

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