1887

Abstract

Resistivity profile data, resulting from combined sounding and profiling, can now be collected with considerable speed due to the development of computerised measuring equipment. Owing to a higher data density and larger quantity of these profile measurements, rapid interpretation procedures are needed. We have developed a fast approximate interpretation procedure based on a deconvolution using the 2D Frechet kernel for the homogeneous halfspace.

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/content/papers/10.3997/2214-4609.201407504
1995-09-25
2020-10-22
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609.201407504
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