Combined Surface-wave and Reflection Data Inversion for High-resolution Near-surface Characterization

In this paper we present a full wave-field inversion approach to address the near-surface problem. Knowing this part of the subsurface will effectively remove its imprint on the target data. We are looking for an elastic, high-resolution model of the near-surface by including iteratively mode conversions, transmission effects and all the internal multiple scattering. An interesting aspect of our work is the natural treatment of surface-waves.