Joint Well-Tie and Wavelet Extraction in the Impedance Domain

We present a new methodology to estimate wavelets and well-ties. We phrase the problem as a joint Bayesian inversion in the impedance domain. This formulation enables us to extract wavelets and well-ties on multiple wells and multiple angle-stacks simultaneously. Extracting multi-well wavelets over the area of interest in the impedance domain ensures that the wavelets are particularly suitable for seismic inversion and reservoir characterization. Furthermore, extracting wavelets and well paths jointly and without manual intervention, ensures repeatability. Using a Bayesian framework allows us to assess the associated uncertainties on the wavelets and well paths.