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Abstract

Summary

BP’s one-dimensional stochastic inversion method (ODiSI) has been widely applied to estimate reservoir properties, facies probabilities and associated uncertainties from seismic data. Currently, the input to ODiSI is relative impedance data. Relative impedance data is rich in low frequencies so captures the thicker layers. In contrast, reflectivity data is dominated by high frequencies and consequently can help with imaging thin layers. This paper will discuss the advantages and disadvantages of using reflectivity data as the input to ODiSI and prove that simultaneous inversion of reflectivity and relative impedance data improves the resolution of the ODiSI products.

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/content/papers/10.3997/2214-4609.202010161
2020-12-08
2024-04-25
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References

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