Determination Of Reservoir Characteristics By Multiple Diffraction Stacking (Mds)

Amplitude-versus-offset or (AVO) analysis is usually<br>carried out by using linear approximations of the<br>Knott-Zoeppritz equation. For comprehensive<br>analysis, a detailed knowledge of velocity model is<br>essential to determine incidence angles using ray<br>tracing. The angular reflection coefficients and the<br>incidence angles are determined by means of doublediffraction<br>stack of common-offset seismic data. For<br>determining zero-offset reflection coefficients is used<br>a true amplitude Kirchhoff migration operator. The<br>two resulting sets are then used in Hilterman's linear<br>approximation of Zoepritz Equations to determine NI<br>and PR. As long as we are within the bounds of<br>assumptions involved, a reasonable estimate of the<br>zero-offset reflection coefficient or the Poisson<br>reflectivity can be made. The data sets of the two<br>parameters are then available for attribute<br>determination and reservoir characterization.