An inverse scattering method is presented for determining near-surface heterogeneities from scattered surface waves in a laterally invariant, layered embedding. The scattered wavefield is represented using a domain-type integral representation and the Born approximation. An ultrasonic laboratory data set is used for imaging the near-surface heterogeneity caused by an epoxy-filled hole in the surface of an aluminium block. The results indicate that it is possible to locate the scatterer and also estimate the actual density contrast as well as its depth dependence.