-
f S Wave Depth Section as a ByProduct of Deep Reflection Profiling
- Publisher: European Association of Geoscientists & Engineers
- Source: Conference Proceedings, 60th EAGE Conference and Exhibition, Jun 1998, cp-110-00244
- ISBN: 978-90-73781-09-2
Abstract
The knowledge of the S-velocity structure is very important for geotechnical and earthqualce engineering. Direct measurements using downhole/crosshole methods are accurate but give only local information and are very expensive. In loose sediments the borehole S-velocity determination methods fall down. The S-refraction/ reflection methods give less accurate information (e.g. on important low velocity layers embedded) with relatively high costs.