1887

Abstract

Practical application aspects of method for joint usage of pressure and shear converted reflected waves for far offset shot points are observed. The efficiency of the method to restore normal reflectivity of corridor stack trace and VSP image is shown to gain higher quality of VSP tie to CMP and log data, to improve resolution and to increase signal/noise ratio. Real data case studies for reflectivity traces, VSP images and sonic impedances are demonstrated

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/content/papers/10.3997/2214-4609.20145584
2010-05-04
2021-01-20
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609.20145584
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