1887

Abstract

We have modified a focusing inversion for electrical and TEM data. The new inversion has been successfully tested on synthetic models. We have demonstrated that modified focusing inversion generates clearer and more focused images for complicated resistivity structures, which can contain inclined boundary.

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/content/papers/10.3997/2214-4609-pdb.20.P048
2006-10-16
2020-10-29
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http://instance.metastore.ingenta.com/content/papers/10.3997/2214-4609-pdb.20.P048
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