1887

Abstract

Summary

Multidimensional stacking was established almost twenty years ago. However, most developments aimed towards new applications of the wavefield attributes. In the last decade multidimensional stacking became an important tool for diffraction imaging. For the purpose of diffraction imaging more accurate stacking operators and advanced parameter estimation were developed. We combine recently presented promising techniques to present a well suited 3D stacking procedure. Our approach images intersecting events and provides high-quality attributes that can be used for diffraction imaging, data interpolation and velocity model building.

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/content/papers/10.3997/2214-4609.201701426
2017-06-12
2024-04-26
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